At ARF Design, we offer specialized Design for Test (DFT) services that are critical to ensuring the manufacturability and reliability of your ASIC designs. Our DFT solutions are designed to maximize test coverage, reduce test costs, and ensure that your silicon meets the highest standards of quality and performance. With a deep understanding of the latest DFT methodologies and tools, we provide end-toend DFT services tailored to your specific needs.
Our DFT design services cover the entire spectrum of testability features, from initial planning and architecture design to implementation and post-silicon validation. We work closely with your design and manufacturing teams to integrate DFT seamlessly into your ASIC designs, ensuring that your products are robust, reliable, and ready for mass production.
We start by developing a custom DFT architecture that aligns with your design goals and manufacturing requirements. Our architects design DFT strategies that optimize test coverage while minimizing the impact on area, power, and performance. We implement a wide range of DFT techniques, including scan insertion, boundary scan (JTAG), built-in self-test (BIST), and more, ensuring comprehensive coverage of potential defects.
Our team is proficient in scan insertion and Automatic Test Pattern Generation (ATPG), key components of any DFT strategy. We generate high-quality test patterns that maximize fault coverage while optimizing for test time and test cost. Our ATPG process is tailored to detect and diagnose faults effectively, helping to ensure that your silicon is defect-free and meets all specifications.
We specialize in implementing BIST solutions for both logic and memory, enabling on-chip testing that reduces the need for external test equipment and accelerates the testing process. Our Memory BIST (MBIST) and Logic BIST (LBIST) implementations are designed for high coverage and reliability, making them ideal for applications that demand rigorous testing standards.
Our DFT services include the integration of boundary scan (JTAG) features, which provide a standardized method for testing interconnects and verifying device integrity. We design and implement JTAG interfaces that facilitate easy access to your ASIC's internal features, enabling efficient testing and debugging during both development and production phases.
Verification is a crucial part of our DFT services. We perform thorough DFT verification at both the RTL and gate levels to ensure that all test features are correctly implemented and function as intended. Our verification process includes fault simulation, timing analysis, and validation against design specifications, ensuring that your DFT strategy is fully optimized before tape-out.
Our commitment to quality extends beyond the design phase. After your ASIC has been fabricated, we provide comprehensive post-silicon support, including test program development, silicon bring-up, and debugging. We work closely with your manufacturing partners to diagnose and resolve any issues that may arise during testing, ensuring that your silicon meets all quality standards.
We conduct detailed test coverage analysis to identify and address any gaps in your DFT strategy. Our optimization process ensures that your design achieves the highest possible test coverage with minimal impact on performance and cost. We use industry-leading tools to perform fault coverage analysis, coverage closure, and test pattern compression, optimizing your design for efficient and cost-effective manufacturing.
To enhance efficiency and consistency, we develop automated DFT flows that streamline the testability implementation process. Our automation solutions include scripts and tools for scan insertion, ATPG, DFT verification, and pattern generation, allowing for faster turnaround times and reduced risk of human error.
We integrate DFT with Design for Manufacturability (DFM) practices to ensure that your ASIC design is optimized not only for testability but also for high yield and reliability in mass production. Our DFMaware DFT strategies help mitigate the impact of process variations and manufacturing challenges, ensuring that your design is robust and ready for large-scale production.
At ARF, we are dedicated to delivering DFT solutions that enhance the testability, reliability, and manufacturability of your ASIC designs. With a team of experienced engineers and a track record of successful DFT implementations, we are your trusted partner in ensuring that your products meet the highest standards of quality and performance.